March 24, 2026 – March 25, 2026
This tutorial provides a structured introduction to the fundamental measurement techniques used for testing and characterizing power semiconductor devices. It is designed to give participants a solid understanding of the measurements required to evaluate power electronic semiconductors and the underlying measurement principles that form the technical basis for reliable characterization.
The program covers switching and commutation behavior of power semiconductor devices within real circuit environments, highlighting the key physical quantities relevant for device testing and performance evaluation. Participants will gain insight into the interpretation and practical use of data sheet parameters, including their relevance and informational value in system design and qualification processes.
In addition, the tutorial addresses the physical and technological fundamentals of various measurement techniques, comparing their respective advantages and limitations. Practical experiments will be demonstrated during the presentations to illustrate key concepts and provide application-oriented examples.
The tutorial is intended for developers of power electronic systems, professionals working in quality management, semiconductor manufacturers, as well as universities and research institutions seeking a deeper technical understanding of device characterization methodologies.