Aehr Test Systems has announced the shipment of its Dual-Echo™ test and burn-in system to a leading global manufacturer of analog and embedded semiconductor devices. The delivery reflects growing demand for Aehr’s lower-power, package-level burn-in systems, which complement its established wafer-level burn-in solutions.

With over 100 Echo systems installed across more than 20 semiconductor companies worldwide, Aehr is experiencing increasing capacity requirements from its customer base. The expanding demand points to broader opportunities for Echo and related systems in both current and emerging markets.

“In addition to the continued strength we are seeing in our wafer-level burn-in business, particularly with multiple leading companies requesting benchmark evaluations for their AI processors, we are seeing increasing demand for our package-level burn-in systems,” said Gayn Erickson, President and CEO of Aehr Test Systems. “This includes our high-power Sonoma systems and our lower-power Echo and Tahoe platforms. We remain committed to our growing customer base and are positioned to scale our offerings further.”

Alberto Salamone, Executive Vice President for Packaged Part Burn-In at Aehr, added, “The Echo continues to demonstrate exceptional reliability and performance, making it one of the most trusted logic burn-in solutions in the market. As we expand production capacity, we are seeing strong and sustained interest in these systems.”

The Echo system is tailored for low-power logic and mixed-signal devices, which represent a significant portion of semiconductor shipments across consumer, industrial, and application-specific segments. Echo forms part of Aehr’s comprehensive burn-in system portfolio, which also includes the Tahoe™ system for medium-power burn-in and the Sonoma™ system for ultra-high-power AI processor burn-in.

Key Features of the Echo System Include:

  • Advanced and intuitive software: A graphical interface designed for engineering flexibility and production security, featuring real-time debug capabilities.
  • Modular hardware with high parallelism: Multi-chamber architecture supports scalable testing with up to four independent thermal zones.
  • Support for digital and analog testing: Ideal for a wide range of mixed-signal and logic devices.

The shipment of the Dual-Echo™ system underscores Aehr’s growing presence in package-level test markets and its continued leadership in high-reliability semiconductor burn-in solutions.

Original – Aehr Test Systems